Academic texts about x-ray reflectivity/ reflectometry

1 publications

Evaluation of Novel Metalorganic Precursors for Atomic Layer Deposition of Nickel-based Thin Films

Autor:in: M.Sc. Nanoelectronic Systems Varun Sharma (Author)

Subject: Physics - Electrodynamics

Category: Master's Thesis , 2015 124 Pages , Grade: 1.0

Catalog Number: 294280

Price: US$ 0.-