de
en
es
fr
Shop
GRIN Website
Publish your texts - enjoy our full service for authors
Academic texts about Test data compression
1 publications
Hybrid Code-Based Test Data Compression and Decompression for VLSI Circuits
Autor:in:
Dr. Kalamani Chinnappa Gounder (Author)
Subject:
Computer Science - Applied
Category:
Doctoral Thesis / Dissertation , 2018 211 Pages , Grade: 6
Catalog Number:
430834
Price:
US$ 46.99
