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Thermo-mechanische und mikrostrukturelle Charakterisierung von Kupfer-Durchkontaktierungen im Silizium (Through Silicon Vias)
Author:
Peter Sättler (Author)
Subject:
Electrotechnology
Category:
Doctoral Thesis / Dissertation, 2015
Price:
US$ 15.99
Messtechnik und Qualitätssicherung im Labor. Ein Praktikumsbericht
Author:
Franz Xaver (Author)
Subject:
Engineering - Industrial Engineering and Management
Category:
Internship Report, 2018
Price:
US$ 16.99
